1980
DOI: 10.1016/0022-3115(80)90317-7
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In-situ impurity measurements in pdx edge plasma

Abstract: The surface analysis station on PDX combines several surface analysis techniques (AES, XPS, SIMS) for in-situ measurement of impurity fluxes in the edge-plasma. The major impurities deposited on a sample surface during non- This aspect is discussed in relation to probable impurity release mechanisms.2

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Cited by 13 publications
(1 citation statement)
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“…There is a variety of deposition 'probes', e.g. post-mortem analysis of portions of limiters [378][379][380] and walls [381,382], etc., longterm samples fixed to the walls [379,383,384], removable probes which integrate over several discharges [196,[385][386][387][388][389][390][391], removable probes which integrate over a complete single discharge [392,393], and probes which time-resolve during a single discharge [394][395][396][397][398][399][400][401][402][403][404][405][406][407]. The extensive literature on deposition probes was recently reviewed by Zuhr et al [377], by Taglauer [408] and by Staudenmaier [409].…”
Section: Measurements Of Impurity Influx and Outfluxmentioning
confidence: 99%
“…There is a variety of deposition 'probes', e.g. post-mortem analysis of portions of limiters [378][379][380] and walls [381,382], etc., longterm samples fixed to the walls [379,383,384], removable probes which integrate over several discharges [196,[385][386][387][388][389][390][391], removable probes which integrate over a complete single discharge [392,393], and probes which time-resolve during a single discharge [394][395][396][397][398][399][400][401][402][403][404][405][406][407]. The extensive literature on deposition probes was recently reviewed by Zuhr et al [377], by Taglauer [408] and by Staudenmaier [409].…”
Section: Measurements Of Impurity Influx and Outfluxmentioning
confidence: 99%