2018
DOI: 10.1038/s41598-018-27332-1
|View full text |Cite
|
Sign up to set email alerts
|

In situ impedance spectroscopy of filament formation by resistive switches in polymer based structures

Abstract: It is shown that the impedance spectroscopy allows identification of the resistive switching mechanisms in complex composite structures. This statement was demonstrated on an example of organic based sandwich structures with a modified polymer matrix as an active element. The impedance spectroscopy scanning was performed for a series of intermediate states formed within the switching process. Analysis of the experimentally obtained impedance spectra shows that the electron transport is provided by delocalized … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
8
0
3

Year Published

2019
2019
2023
2023

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 14 publications
(11 citation statements)
references
References 21 publications
0
8
0
3
Order By: Relevance
“…In contrast, the current level in the LRS of Device 2 saturated at a certain value (≈8 × 10 −6 A) below the CC (Figure 2b), indicating that the CF growth was controlled to avoid the overshoot phenomenon. Because the overshoot current can be minimized by connecting an external load resistor, [ 23 ] the ILP in Device 2 can be considered as a load resistor that defines the self‐CC. Figure S3 in the Supporting Information shows the transient current of each device (Device 1 and Device 2) under the voltage pulse.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…In contrast, the current level in the LRS of Device 2 saturated at a certain value (≈8 × 10 −6 A) below the CC (Figure 2b), indicating that the CF growth was controlled to avoid the overshoot phenomenon. Because the overshoot current can be minimized by connecting an external load resistor, [ 23 ] the ILP in Device 2 can be considered as a load resistor that defines the self‐CC. Figure S3 in the Supporting Information shows the transient current of each device (Device 1 and Device 2) under the voltage pulse.…”
Section: Resultsmentioning
confidence: 99%
“…[18][19][20] However, for the solution-processed flexible organic systems, the orthogonal characteristics and wetting properties of solvents restrict the preparation of an interfacial layer onto the underlying polymer electrolyte, [21] and thus, a method for regulating electric potential by connecting an external load resistor or a transistor to the memristor is generally used. [11,22,23] Although regulating the electric potential is effective for suppressing CF overgrowth, and thereby enhancing the reliability and reducing the operating current of the device, such complex circuits inevitably limit the integration density of a flexible In flexible neuromorphic electronics, solution-processed organic memristors are important elements to perform memory functions. Despite considerable development for improving performances of organic memristors, the devices still exhibit the poor reliability and uniformity due to the stochastic characteristics of the conductive filament (CF) growth.…”
Section: Introduction Of Interfacial Load Polymeric Layer To Organic Flexible Memristor For Regulating Conductive Filament Growthmentioning
confidence: 99%
“…Добавление в измерительную схему нагрузочного резистора последовательно с образцом позволяло перераспределить напряжение между образцом и нагрузочным резистором. Варьирование величины нагрузочного сопротивления от 1 Ом до 1.66 МОм позволило изменять соотношение тока и напряжения на образце и, как следствие, зафиксировать образец в проводящем, метастабильном или непроводящем состоянии [14].…”
Section: методика эксперимента и исследованные образцыunclassified
“…Различия в несколько порядков для сопротивления проводящего состояния пленок PhPorphErOAc, PhSubPcBBr и PhNcLuPhPc связаны с различным диаметром единичного канала [15,16] и различной плотностью каналов в единице объема [14]. Формирование канала обусловлено диффузией ионов металла из контакта [17].…”
Section: обсуждение результатовunclassified
See 1 more Smart Citation