In situ high voltage tem observation of an electrohydrodynamic (EHD) ion source

Benassayag, Gérard; Sudraud, P.; Jouffrey, B.

doi:10.1016/s0304-3991(85)80002-4

Cited by 95 publications

(42 citation statements)

References 15 publications

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“…The development of a dynamical instability is the basic principle behind the operation of electrohydrodynamic sources. This mechanism is consistent with the experimental results of Ben Assayag et al (4). Who used transmission electron microscopy to observe in situ the surface of an emitting liquid metal ion source.…”

Section: Introductionsupporting

confidence: 89%

“…The pressure should be the same as that in an inviscid fluid because the presence of viscosity affects the wave frequency but not the pressure within the fluid. Since configurations must satisfy the Navier-Stokes equation [4] with zero velocity field and no time dependence given, P 0 ϩ gy ϭ ϭ constant, [6] and takes two different values for each medium that we will call effective pressures.…”

Section: Electrohydrodynamic Model and The Fundamental Equationsmentioning

confidence: 99%

See 1 more Smart Citation

Nonlinear Stability of an Electrified Interface Supporting Surface Charges between Two Viscous Fluids

El‐Dib

1999

Journal of Colloid and Interface Science

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Section: Introductionsupporting

confidence: 89%

Section: Electrohydrodynamic Model and The Fundamental Equationsmentioning

confidence: 99%

Nonlinear Stability of an Electrified Interface Supporting Surface Charges between Two Viscous Fluids

El‐Dib

1999

Journal of Colloid and Interface Science

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“…Simulations and measurements have shown that, for currents smaller than ϳ10 A, the length of the cusp is almost zero but increases significantly at higher emission currents. 2 The radius of the cusp is estimated from transmission electron micrographs as 1.5 nm, 3 a value that was recently found to be in agreement both with the electrohydrodynamics of the source 4 and with simulations of the source energy spread. 5 One would expect the virtual source size of the LMIS, i.e., the apparent source size looking back through an optical system, to be of the order of the cusp radius, i.e., 1.5 nm.…”

Section: Introductionmentioning

confidence: 66%

Brightness measurements of a gallium liquid metal ion source

Hagen

Fokkema

Kruit

2008

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

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The virtual source size of a liquid metal ion source is an order of magnitude larger than the size of the region from which the ions are emitted at the source. This source size has a direct effect on the reduced brightness and, hence, on the performance of these sources. The variation of the virtual source size of a gallium liquid metal ion source as a function of the angular current density at the source has been measured. This was done by measuring the source image size from images of a pencil lead sample taken with an FEI focused ion beam system. The measurements indicate that the virtual source size grows from about 50-80 nm when the emission current increases from 1 to 10 A. The experimental data on the virtual source size are compared with the theory on stochastic Coulomb interactions in the source region. On the basis of these measurements the authors show that the reduced brightness deteriorates with an increasing angular current density. The maximum reduced brightness measured was 1 ϫ 10 6 A / ͑m 2 sr V͒.

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“…Des observations faites par microscopie électro-nique à 3 MeV [8] sur une pointe LMIS de gallium en cours de fonctionnement montrent que des jets extrêmement fins se forment. Des diamètres de 3 nm ont été mesurés.…”

Section: Version Française Abrégéeunclassified

“…High voltage transmission electron microscope (HV-TEM) observations made by Benassayag, Sudraud and Jouffrey [8] on an operating Ga LMIS shows that extremely thin jets are formed. Diameters of the order of 3 nm were observed.…”

Section: High Voltage Electron Microscope Observationmentioning

confidence: 99%