“…Although turn-key solutions for the in-laboratory measurement of physical properties under combined LT/HP conditions are readily commercially available (for example in the case of Quantum Design's MPMS/PPMS devices equipped with pressure cells), XRD measurements under the same conditions are still an expert topic and usually limited to diffractometers at specialized synchrotron beamlines (Gerard & Pernolet, 1973;Morosin & Schirber, 1974;Chasseau et al, 1993;Tang et al, 1998;Ohwada et al, 2001;Takemura et al, 2002;Suzuki & Endo, 2003;Guionneau et al, 2004;Yoshimura et al, 2006;Bizen et al, 2008;Zimmermann et al, 2008;Mittal et al, 2011;Shepherd et al, 2011;Li et al, 2012;Tse et al, 2012;Cameron, 2014;Yamada et al, 2014;Hejny & Minkov, 2015;Elatresh et al, 2017;Shen & Mao, 2017;Povedano et al, 2020).…”