“…Many efforts have been made to enable quantitative electron microscopy of the materials as synthesized, imaged at lower incident electron doses where electron beam damage can be avoided (Migunov et al, 2015;Mittelberger et al, 2018;Egerton, 2019;Van Aert et al, 2019;Nicholls et al, 2020). Furthermore, the field of electron microscopy for material science is strongly evolving toward more in situ studies, where environmental conditions greatly complicate image acquisition Haimei & Yimei, 2017;Vanrompay et al, 2018;Gavhane et al, 2021). Both these evolutions entail more noisy electron microscopy images, leading to a larger amount of uncertainty in the interpretation.…”