2000
DOI: 10.1068/htwu372
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In-situ diagnostics of the interaction region between a nitrogen - oxygen plasma jet and hot C/C - SiC ceramic materials

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Cited by 6 publications
(1 citation statement)
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“…Hirsch et al, 52 Altman et al, 53 and Jentschke et al 54 have monitored Si atom densities in front of C/C-SiC composites exposed to nitrogen-oxygen plasma flows, using high-resolution spectroscopy of Si I multiplet emissions in the 250-253-nm range. Herdrich et al 55 observed Si emission near 252 nm and 288 nm while testing SiC specimens in oxygen-nitrogen plasmas, and also captured emission from SiO 2 molecules near 423 nm.…”
Section: Gas Emission Spectroscopymentioning
confidence: 98%
“…Hirsch et al, 52 Altman et al, 53 and Jentschke et al 54 have monitored Si atom densities in front of C/C-SiC composites exposed to nitrogen-oxygen plasma flows, using high-resolution spectroscopy of Si I multiplet emissions in the 250-253-nm range. Herdrich et al 55 observed Si emission near 252 nm and 288 nm while testing SiC specimens in oxygen-nitrogen plasmas, and also captured emission from SiO 2 molecules near 423 nm.…”
Section: Gas Emission Spectroscopymentioning
confidence: 98%