2011
DOI: 10.1088/1742-6596/286/1/012009
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In-situ conductivity and UV-VIS absorption monitoring of iodine doping-dedoping processes in poly(3-hexylthiophene) (P3HT)

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Cited by 9 publications
(7 citation statements)
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“…51,52 This can be clearly seen even during capturing of a single C-AFM image (see Fig. 51,52 This can be clearly seen even during capturing of a single C-AFM image (see Fig.…”
Section: Iodine Dedopingmentioning
confidence: 94%
“…51,52 This can be clearly seen even during capturing of a single C-AFM image (see Fig. 51,52 This can be clearly seen even during capturing of a single C-AFM image (see Fig.…”
Section: Iodine Dedopingmentioning
confidence: 94%
“…Some of the earliest molecular dopants for conjugated polymers were halogen vapors, [12] but the instability of the doped films produced this way has led to the design of more stable molecular dopants. [13] One of the most popular molecular dopants for conjugated polymers is 2,3,5,6-tetrafluoro-7,7,8,8-tetracyanoquinodimethane (F 4 TCNQ); [4][5][6][7][8][9][14][15][16][17][18][19][20][21][22] see Fig. 1a (red) for chemical structure.…”
Section: Introductionmentioning
confidence: 99%
“…5,[14][15][16] In situ UV-vis absorption has been successfully implemented on non-rotating samples, either on the surface of a microscope slide or inside a cuvette or capillary, to monitor the kinetics and evolution of different chemical species and phases during the polymerization, reduction and doping of organic materials. [17][18][19] UV-vis reectometry, or ellipsometry in the reection mode, have also been used in the past, 5,16,[20][21][22][23][24][25] but these are usually less sensitive to the absorption characteristics and require model denition and tting (transfer matrix formulation) based on prior knowledge about the sample (optical properties and layer thickness), in order to extract the absorption spectra, and are usually ineffective for thick solution lms. More direct measurement of the thin lm crystallinity and phase separation during spin-coating can be achieved by performing in situ grazing incidence wide and/or small angle X-ray scattering during spin-coating, 24,26,27 but this requires the use of a synchrotron X-ray source, making it impossible to perform on site, difficult to perform routinely, and cost-prohibitive to perform in-line during actual manufacturing.…”
Section: Introductionmentioning
confidence: 99%