“…5,[14][15][16] In situ UV-vis absorption has been successfully implemented on non-rotating samples, either on the surface of a microscope slide or inside a cuvette or capillary, to monitor the kinetics and evolution of different chemical species and phases during the polymerization, reduction and doping of organic materials. [17][18][19] UV-vis reectometry, or ellipsometry in the reection mode, have also been used in the past, 5,16,[20][21][22][23][24][25] but these are usually less sensitive to the absorption characteristics and require model denition and tting (transfer matrix formulation) based on prior knowledge about the sample (optical properties and layer thickness), in order to extract the absorption spectra, and are usually ineffective for thick solution lms. More direct measurement of the thin lm crystallinity and phase separation during spin-coating can be achieved by performing in situ grazing incidence wide and/or small angle X-ray scattering during spin-coating, 24,26,27 but this requires the use of a synchrotron X-ray source, making it impossible to perform on site, difficult to perform routinely, and cost-prohibitive to perform in-line during actual manufacturing.…”