In situ Conductance Measurement of a Limited Number of Nanoparticles during Transmission Electron Microscopy Observation

Abstract

The gauge-links connecting the parton field operators in the hadronic matrix elements appearing in the transverse momentum dependent distribution functions give rise to T -odd effects. Due to the process-dependence of the gauge-links the T -odd distribution functions appear with different prefactors. A consequence is that in the description of single spin asymmetries the parton distribution and fragmentation functions are convoluted with gluonic pole cross sections rather than the basic partonic cross sections. In this paper we calculate the gluonic pole cross sections encountered in single spin asymmetries in hadronhadron scattering. The case of back-to-back pion production in polarized proton-proton scattering is worked out explicitly. It is shown how T -odd gluon distribution functions originating from gluonic pole matrix elements appear in twofold.

Conductance measurements of nanoscale regions with in situ transmission electron microscopy

“…Compared with our earlier work using a 40 nm thick Fe-SrF 2 (~ 37 vol% Fe) without the SrF 2 top layer [11], the current in this work is about one order smaller. This is thought to be due to the existence of the 1 nm thick SrF 2 top layer.…”

“…With this in mind, combined TEM/STM experiments have been successfully performed to correlate the geometry and the electric properties of metallic nanowires [8][9][10] (TEM: transmission electron microscopy; even without the feedback control, the word STM is used in this report). A similar experiment was carried out on metal-insulator granular films composed of metallic nanoparticles dispersed in an insulator matrix, and a clear Coulomb blockade effect was confirmed at room temperature (RT) when the contact area was small [11].…”

“…The fundamental design is same as the designs of those developed for studies on metallic nanowires [10,12]. The holder is loaded with three mechanical micrometers for a coarse Au-tips movement (µm -mm) and a tube-type piezoactuator for a fine Au-tips movement (nm -µm) which is controlled by the piezo controller with the output voltage of ± 100 V. By using the stepping motor controller, a motor installed in this holder can be rotated, and one of the two Au-tips were selected for the experiment without breaking the vacuum [11]. The current between Au electrodes were measured by using the current-to-voltage converter and the STM measurement unit.…”

In-situ transmission electron microscopy of conductive filaments in NiO resistance random access memory and its analysis

“…16,24 The in-situ TEM observation system was composed of a custom-made TEM holder attached with a piezo actuator. [26][27][28][29] The TEM instrument we used was mainly a JEM-2010 microscope (200 kV, C s ¼ 0.5 mm, 10 À5 Pa) with a CCD video camera to record the TEM images. In the TEM holder, the wedge-shaped ReRAM sample described above and a tip-shaped counter electrode made of Pr-Ir working as a TE were placed.…”

“…One method is in-situ transmission electron microscopy (TEM), where electric measurements and geometric and crystallographic observations can be simultaneously performed. [26][27][28][29] have been investigated by in-situ TEM. The first one was PCMO which shows the bipolar switching.…”