In-Situ Characterization of Growth and Interfaces in a-Si:H Devices: Annual Subcontract Report, 1 May 1992 - 30 April 1993

Collins, R. W.; Wronski, C. R.; An, Ilsin; Lü, Ying; Nguyen, Hong-Hai

doi:10.2172/10131218

1994

DOI: 10.2172/10131218

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In-Situ Characterization of Growth and Interfaces in a-Si:H Devices: Annual Subcontract Report, 1 May 1992 - 30 April 1993

R. W. Collins¹,

C. R. Wronski²,

Ilsin An³

et al.

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In-Situ Characterization of Growth and Interfaces in a-Si:H Devices: Annual Subcontract Report, 1 May 1992 - 30 April 1993

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