2019
DOI: 10.1515/ntrev-2019-0032
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In situ capabilities of Small Angle X-ray Scattering

Abstract: Small Angle X-ray Scattering (SAXS) is an ideal characterization tool to explore nanoscale systems. In order to investigate nanostructural changes of materials under realistic sample environments, it is essential to equip SAXS with diverse in situ capabilities based on the corresponding requirements. In this paper, we highlight the representative experimental setups and corresponding applications of five widely used in situ capabilities: temperature, pressure, stretching, flow-through, and electric field. Addi… Show more

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Cited by 16 publications
(5 citation statements)
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“…For many amorphous mesoporous materials, the fractal dimension of the surface is somewhere in between: 2 < D f < 3 . This was confirmed by many experimental studies [331,333,340], using adsorption measurements and small-angle X-ray scattering [341,342]. The surface roughness that is inherent to amorphous materials can be accounted for in studies of diffusion and reaction in mesopores [336,337].…”
Section: Pore Network Modelsmentioning
confidence: 66%
“…For many amorphous mesoporous materials, the fractal dimension of the surface is somewhere in between: 2 < D f < 3 . This was confirmed by many experimental studies [331,333,340], using adsorption measurements and small-angle X-ray scattering [341,342]. The surface roughness that is inherent to amorphous materials can be accounted for in studies of diffusion and reaction in mesopores [336,337].…”
Section: Pore Network Modelsmentioning
confidence: 66%
“…Generally, an insulating layer with the smooth surface is favorable for forming good interface contact with electron devices, which can improve the electrical performance and the stability of the devices [19]. Because the Al 2 O 3 film was very thin, we did not detect any signal in the small incident angle XRD measurement [20]. Therefore, we performed XRD tests on the precipitate collected in the growth liquid instead, because the precipitate had exactly the same composition and structure as the film.…”
Section: Characterization Of Al 2 O 3 Thin Filmsmentioning
confidence: 87%
“…59 For a deeper reading numerous review articles provide excellent overviews of the physical background, technical issues, and examples of use. [60][61][62][63] The application of in situ SAXS is mainly used to study formation pathways during the crystallization of porous materials as well as to monitor adsorption processes in nanoporous compounds. In 2011 in situ SAXS and in situ wide-angle X-ray scattering (WAXS) were combined for the first time to study the crystallization of two metal-organic frameworks synthesized from similar metal and organic precursors, NH 2 -MIL-101(Al) and NH 2 -MIL-53(Al).…”
Section: In Situ Saxsmentioning
confidence: 99%