2013
DOI: 10.1364/ao.52.000323
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In situ calibration of an extreme ultraviolet spectrometer for attosecond transient absorption experiments

Abstract: We report a method for calibrating an extreme ultraviolet spectrometer based on a flat-field grazing incidence spherical grating in the energy range of 20-30 eV. By measuring absorption lines corresponding to singly excited states in helium atoms and autoionizing states in argon atoms, the photon energy of the detected light was determined. The spectral resolution of the spectrometer, 60 meV, was obtained by deconvolving the Fano resonance profile of argon autoionizing states from the measured absorption line … Show more

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Cited by 23 publications
(16 citation statements)
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References 21 publications
(29 reference statements)
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“…Absorption near the 1s n p excited state energy levels became comparable to the above-threshold absorption with the addition of the laser field. The transmitted spectra were measured using a home-built XUV spectrometer21 based on a flat-field grazing incidence reflection grating (Hitachi 001-0640) as a function of the time delay, with delay steps of 140  as . The spectrometer resolution was approximately 50 meV within the energy range of interest.…”
Section: Methodsmentioning
confidence: 99%
“…Absorption near the 1s n p excited state energy levels became comparable to the above-threshold absorption with the addition of the laser field. The transmitted spectra were measured using a home-built XUV spectrometer21 based on a flat-field grazing incidence reflection grating (Hitachi 001-0640) as a function of the time delay, with delay steps of 140  as . The spectrometer resolution was approximately 50 meV within the energy range of interest.…”
Section: Methodsmentioning
confidence: 99%
“…A hole-drilled mirror was placed between the toroidal mirror and the second gas cell to combine a time-delayed replica of the driving NIR pulse with the SIAP. After the absorption cell, the transmitted portion of the SIAP was sent to a home-built XUV spectrometer [19], in which the SIAPs were dispersed by a flat-field grating and detected by a microchannel plate (MCP)-phosphor detector which was imaged onto a thermoelectrically cooled CCD. The XUV spectrometer resolution was better than 50 meV in the energy range of interest, as determined by measuring the bound-state absorption lines near the ionization thresholds of neon, argon, and helium.…”
Section: Methodsmentioning
confidence: 99%
“…The delay was scanned using a mirror mounted on a piezoelectric stage and was actively stabilized to an error of ∼25 asec RMS during the experiments. Details of the experimental setup can be found in previous publications [4,29] and references therein.…”
Section: A Experimental Setupmentioning
confidence: 99%