In-line broadband 270° (3λ/4) chevron four-reflection wave retarders

Azzam, R. M. A.; Khanfar, Hazem K.

doi:10.1364/ao.47.004878

Cited by 3 publications

(1 citation statement)

References 10 publications

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“…Reflective quarter-wave plates (QWPs) for the infrared (IR) have utilized several different technologies to achieve circularly polarized (CP) light upon reflection [1][2][3][4][5][6][7]. For instance, reflective prisms [1,2] with or without thin-film interference layers [3,4] have been demonstrated to provide a π/2 phase shift between orthogonal field components over a broad spectrum of IR wavelengths. Additionally, microstructured surfaces have been shown to produce QWP behavior over a narrow band typically centered on 10.6 μm while simultaneously achieving high reflectivity [5][6][7].…”

Section: Introductionmentioning

confidence: 99%

Broadband infrared meanderline reflective quarter-wave plate

Wadsworth¹,

Boreman²

2011

Opt. Express

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We present a novel reflective quarter-wave plate comprised of subwavelength meanderline elements. The device is operational over the long-wave infrared (LWIR) spectrum, with significant spectral and angular bandwidths. Power reflection is approximately 70% over the majority of the LWIR. Efficient conversion from a 45° linear polarization state into circular polarization is demonstrated from finite-element electromagnetic simulations and from broadband polarimetric measurements.

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Section: Introductionmentioning

confidence: 99%

Broadband infrared meanderline reflective quarter-wave plate

Wadsworth¹,

Boreman²

2011

Opt. Express

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Polarization, thin-film optics, ellipsometry, and polarimetry: Retrospective

Azzam

2019

Journal of Vacuum Science &Amp; Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phen

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As plenary speaker at the 2019 ICSE-8 Conference in Barcelona, Spain, the author was invited to review several of his published contributions to polarization optics of interfaces and thin films, ellipsometry, and polarimetry over the past 50 years. This paper is an abridged account of his oral presentation. The author reconsiders the reflection of p- and s-polarized and unpolarized light at dielectric-dielectric and dielectric-conductor interfaces and obtains interesting results. For example, the author shows how the retrieval of the reflection phase shift of s-polarized light from p and s intensity reflectance data enables the determination of the complex dielectric function of an absorbing medium on a wavelength-by-wavelength basis without ellipsometry or Kramers–Kronig analysis. Novel achromatic and angle-insensitive single- and four-reflection wave retarders are presented that are particularly suited for the near IR. The author also shows how binary-thickness thin-film optical coatings on a high-index substrate can generate binary spatial and temporal polarization modulation by reflection. Finally, O'Bryan's 1936 vacuum ellipsometer is revisited and the author shows how it can be adapted for the measurement of the optical properties of absorbing liquids using attenuated total reflection spectroscopic ellipsometry.

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Total internal reflection without change of polarization using a right-angle prism with half-wavelength-thick optical interference coating

Azzam

2009

Opt. Lett.

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Monochromatic light, which is polarized in an arbitrary state, is totally internally reflected at angle of incidence phi=45 degrees without change of polarization by a right-angle prism of refractive index n0=1+1/Square root of 2=1.70711 (e.g., N-LAK8 Schott glass at wavelength lambda=706 nm), which is coated with a transparent thin film of refractive index n1=(1+1/2)1/2=1.30656 (e.g., vacuum-deposited fluoride material) and of metric thickness equal to half of the vacuum wavelength of incident light, d=lambda/2. The ambient medium of evanescent refraction is assumed to be vacuum, air, or an inert gas. Wavelength shifts of +/-50 nm, or changes of the internal angle of incidence of +/-1 degrees around 45 degrees, cause phase errors of only a few degrees. The reflected and incident polarization states are nearly identical in the presence of such small phase errors.

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In-line broadband 270° (3λ/4) chevron four-reflection wave retarders

Cited by 3 publications

References 10 publications

Broadband infrared meanderline reflective quarter-wave plate

Broadband infrared meanderline reflective quarter-wave plate

Polarization, thin-film optics, ellipsometry, and polarimetry: Retrospective

Total internal reflection without change of polarization using a right-angle prism with half-wavelength-thick optical interference coating

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