2019
DOI: 10.21014/acta_imeko.v7i4.599
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In-field monitoring of eight photovoltaic plants: degradation rate along seven years of continuous operation

Abstract: <p class="Abstract">The results of more than seven years (October 2010-December 2017) of continuous monitoring are presented in this paper. Eight outdoor photovoltaic (PV) plants were monitored. The monitored plants use different technologies: mono-crystalline silicon (m-Si), poli-crystalline silicon (p-Si), string ribbon silicon, copper indium gallium selenide (CIGS), thin film, and cadmium telluride (CdTe) thin film. The thin-film and m-Si modules are used both in fixed installations and on x-y trackin… Show more

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Cited by 12 publications
(6 citation statements)
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“…These panels are also referred to as 'many-crystal' or 'multi-crystalline' silicon. Since there are many crystals in each cell, the electrons have less freedom to move; this results in lower efficiency than that typical of the mono-Si panels [42].…”
Section: Discussionmentioning
confidence: 99%
“…These panels are also referred to as 'many-crystal' or 'multi-crystalline' silicon. Since there are many crystals in each cell, the electrons have less freedom to move; this results in lower efficiency than that typical of the mono-Si panels [42].…”
Section: Discussionmentioning
confidence: 99%
“…The renormalization is less fundamental when performing a space comparison during a given period because it is supposed that nearby wind turbines are subjected to reasonably similar conditions. Regarding this point, the literature also provides more complex renormalization methods [10,24] based on statistical analysis or design specifications in order to compensate for the absence of a ground-truth reference.…”
Section: Scada Data Analysismentioning
confidence: 99%
“…The easiest way is the use of a resistive load with variable resistance; nevertheless, this method has a long duration because a resistance linearly varies from zero to infinity in order to scan the points of the I-V curve of the generator [22]. On the contrary, the tests are easily and rapidly performed by the transient charge of a capacitive load [23,24]. An external capacitor, initially discharged, is charged by the PV array from short-circuit to open-circuit conditions.…”
Section: I-v Curve Characterizationmentioning
confidence: 99%
“…Considering the analysis in references [86][87][88], Rout is calculated as follows For this purpose, it is necessary to find R out . The operation of the PV is still in the current source region assuming that it has voltage V 1 and current I 1 , and using Equation (24), R out is calculated. The next step is to find the values of I 2 and V 2 in Equation (23).…”
Section: Application Of Submodule Integrated Mppt With Fault Diagnosismentioning
confidence: 99%