In-Depth Analysis of Transistor Influence on OxRAM Performance in Memory Bitcell, With Technology Scaling Perspectives

Berthaud, F.; Martin, S.; Rottner, J.; Meli, V.; Nodin, J.-F.; Grenouillet, L.; Ricavy, S.; Cassé, M.; Castellani, N.

doi:10.1109/ted.2024.3364114

IEEE Trans. Electron Devices

2024

DOI: 10.1109/ted.2024.3364114

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In-Depth Analysis of Transistor Influence on OxRAM Performance in Memory Bitcell, With Technology Scaling Perspectives

F. Berthaud,

S. Martin,

J. Rottner

et al.

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In-Depth Analysis of Transistor Influence on OxRAM Performance in Memory Bitcell, With Technology Scaling Perspectives

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References 25 publications

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