In
a broad probing spectral range covering visible to NIR, the
transient reflectance study on bismuth selenide thin films, especially
of 5–15 nm thickness, has not been carried out before. The
independent carrier lifetimes in these films and the observation of
resonant states in 10 nm thin films require an in-depth analysis of
charge carriers and phonon modes to investigate the intrinsic states
and to understand the probe-, pump-, and temperature-dependent effects.
In this perspective, molecular beam epitaxy is used to grow 5-, 10-,
and 15 nm-thin films of bismuth selenide, which are capped with a
selenium layer of 1 nm on a c-cut sapphire substrate.
After the structural and phonon-mode studies, reflectance spectroscopy
is utilized to determine the refractive index of different thicknesses
of films. Transient reflectance ultrafast spectroscopy is employed
to probe the dynamics in the broad visible to NIR range, highlighting
that the resonant feature is probe- and pump-dependent. Furthermore,
temperature-dependent investigations in 10 nm films are performed
to identify the intrinsic origin of the resonance effects down to
5 K. This article provides a comprehensive investigation of thin films
of bismuth selenide to model the characteristic difference in the
response of surface states with film thickness.