In-circuit irradiation effect test of electronic components using transient high dose rate X-ray source at high power laser facility

Tao, Yi; Pinyang, Liu; Zongqing, Zhao; Dong, Yang; Hang, Zhou; Bo, Yu; Xiaodong, Guo; Gang, Xiong

doi:10.1109/icet61945.2024.10672937

2024 7th International Conference on Electronics Technology (ICET) 2024

DOI: 10.1109/icet61945.2024.10672937

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In-circuit irradiation effect test of electronic components using transient high dose rate X-ray source at high power laser facility

Yi Tao,

Liu Pinyang,

Zhao Zongqing

et al.

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In-circuit irradiation effect test of electronic components using transient high dose rate X-ray source at high power laser facility

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