Improving the Speed and Accuracy of Large-scale Scanning Transmission Electron Microscopy (STEM) Electron Scattering Simulations

Abstract

This is an Accepted Manuscript for the Microscopy and Microanalysis 2020 Proceedings. This version may be subject to change during the production process.

A Fast Algorithm for Scanning Transmission Electron Microscopy Imaging and 4D-STEM Diffraction Simulations

“…With the additional back-propagation, the partitioned PRISM model then readswhere t was the total sample thickness defined above. While re-focusing the -matrix beams in the PRISM algorithm (Ophus et al, 2020) is optional to further reduce approximation errors, in the partitioned PRISM algorithm it is essential to achieve high accuracy.…”