2022
DOI: 10.1021/acsaem.1c03876
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Improving the Quality of CsPbBr3 Films by Applying the Light Soak

Abstract: A technique for improving the quality of CsPbBr3 films by combing the annealing and the light soak is proposed and experimentally demonstrated. Well-organized CsPbBr3-based solar cells with an optimized power conversion efficiency of about 8.6% are obtained. The efficiency is improved by about 28% compared to that of the solar cells based on the films treated only by the post-annealing process. The light-soak effects on the improvement of CsPbBr3 films may open a route in fabricating high-quality film solar ce… Show more

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Cited by 3 publications
(6 citation statements)
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“…However, the intensity has significantly increased in modified samples, indicating the inhibition of nonradiative recombination. These findings are consistent with previous research. The carrier lifetime can be derived from the decay curves of photoluminescence intensity using a biexponential decay equation: I ( t ) = I 0 + A 1 exp­(− t /τ 1 ) + A 2 exp­(− t /τ 2 ), where τ 1 and τ 2 correspond to fast decay time constants and slow decay time constants, respectively. , The average carrier lifetime (τ avg ) can be calculated as τ avg = (A 1 τ 1 2 + A 2 τ 2 2 )/(A 1 τ 1 + A 2 τ 2 ). For the TRPL measurements, the PL lifetimes of modified perovskite films are consistently longer than those of the control sample (Table ).…”
Section: Resultssupporting
confidence: 90%
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“…However, the intensity has significantly increased in modified samples, indicating the inhibition of nonradiative recombination. These findings are consistent with previous research. The carrier lifetime can be derived from the decay curves of photoluminescence intensity using a biexponential decay equation: I ( t ) = I 0 + A 1 exp­(− t /τ 1 ) + A 2 exp­(− t /τ 2 ), where τ 1 and τ 2 correspond to fast decay time constants and slow decay time constants, respectively. , The average carrier lifetime (τ avg ) can be calculated as τ avg = (A 1 τ 1 2 + A 2 τ 2 2 )/(A 1 τ 1 + A 2 τ 2 ). For the TRPL measurements, the PL lifetimes of modified perovskite films are consistently longer than those of the control sample (Table ).…”
Section: Resultssupporting
confidence: 90%
“…The results are shown in Figure c. The trap-state density ( N trap ) can be calculated using the equation: N trap = (2 V TFL εε 0 )/( eL 2 ), where the dielectric constant is represented by ε, ε 0 denotes the vacuum permittivity, e is the charge of an electron, and L is the thickness of the film. , V TFL is obtained through data fitting. The calculated value of N trap decreases from 3.42 × 10 16 cm 3 for the control sample to 3.07 × 10 16 cm 3 for the modified sample.…”
Section: Resultsmentioning
confidence: 99%
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