Improving the analytical performance of pulsed-GD-SFMS for multi-elemental depth profile analysis of heat-treated Zn coatings on extruded aluminium

Abstract

An improved analytical method based on pulsed glow discharge sector field mass spectrometry is investigated for fast and sensitive multi-elemental depth profiling of heat-treated Zn coatings on extruded aluminium.

Mass Spectrometry‐based Techniques for Direct Quantification of High Ionization Energy Elements in Solid Materials—challenges and Perspectives

“…Thus, RSFs are widely implemented for calibration, which significantly simplifies the quantification compared with, for example, SIMS (Konarski et al, 2008). GDMS is applicable for depth analysis of both thin films and multilayer coatings with good spatial resolution and scanning speed (Pisonero et al, 2006, 2012, 2019; Lobo, Fernández, & Pereiro, 2017).…”

Exploration of LIBS as a novel and rapid elemental mapping technique of nuclear fuels in the form of surrogate TRISO particles

“…Pisonero et al had seen similar results when using glow discharge (GD) – sector field mass spectrometry (SFMS) for the analysis of heat-treated coatings. 29…”

“…Pisonero et al had seen similar results when using glow discharge (GD)sector eld mass spectrometry (SFMS) for the analysis of heat-treated coatings. 29 The slow decay of the Zr moving into the PyC layer and the slow decay of the C moving into the ZrO 2 kernel is likely due to re-depositing of the ablated material from the previous shots/ sampling of the laser crater side wall. This 'smearing' between layers has been seen in other LIBS depth proling work.…”

Atomic spectrometry update: review of advances in the analysis of metals, chemicals and materials

“…A paper by Pisonero et al used GD-SF-MS in the pulsed mode for the multi-elemental (major, minor and trace) depth-profiling analysis of heat-treated zinc coatings on extruded aluminium. 36 Parameters including the GD source design, the discharge conditions and the mass spectra acquisition conditions were optimised to obtain low sputtering rates, high mass spectra acquisition rates, high speed and improved depth-profiling resolution. Relative sensitivity factors did not change with the matrix when the GD was operated in pulse mode.…”