2018
DOI: 10.1016/j.mssp.2017.10.007
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Improving microstructural properties and minimizing crystal imperfections of nanocrystalline Cu 2 O thin films of different solution molarities for solar cell applications

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Cited by 113 publications
(38 citation statements)
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“…While the dislocation density ( δ ) was used to define the length of dislocation lines per unit volume. Moreover, δ represents the number of defects in the film and is estimated as δ = 1/ D 2 . The strain ( ε ) in the film microstructure is evaluated as ε = β cos θ /4 .…”
Section: X‐ray Diffraction Analysismentioning
confidence: 99%
“…While the dislocation density ( δ ) was used to define the length of dislocation lines per unit volume. Moreover, δ represents the number of defects in the film and is estimated as δ = 1/ D 2 . The strain ( ε ) in the film microstructure is evaluated as ε = β cos θ /4 .…”
Section: X‐ray Diffraction Analysismentioning
confidence: 99%
“…[43]. We calculated the density of dislocations (δ) by using the line profile analysis of X-ray diffractions (LPA-XRD) and using simple Williamson-Smallman formula given by δ = 1/D 2 [33,[43][44][45][46], where D is the value of the crystallite size. Figure 4a shows the dislocation density of the undoped ZnO film and the Fe-Ni co-doped ZnO thin films as a function of Fe-Ni concentrations.…”
Section: Dislocation Density and Crystalline Densitymentioning
confidence: 99%
“…The value of the strain energy density within thin films (E d ) [J/m 3 ] depends on the Young's modulus of the film, the volume of the unit cell (V) and the internal micro strain, ε . The strain energy density can be expressed as [44,52],…”
Section: Crystal Imperfections Studiesmentioning
confidence: 99%
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“…These minute changes in the material may be influence on the catalytical and desired substantial properties. Literature also reports that these minute defects leads to decrease the sensing and adsorption related properties of solid materials [13][14][15].…”
Section: Introductionmentioning
confidence: 99%