2007
DOI: 10.1016/j.diamond.2006.11.099
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Improving diamond detectors: A device case

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Cited by 72 publications
(33 citation statements)
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“…In addition to the influence of N s on the defect levels of the crystals, the more defective nature of the CVD diamonds compared to the HPHT diamond could also be ascribed to their polycrystalline structure as polycrystalline materials have high defect densities due to their non-homogeneous structure (Bergonzo et al, 2007). Particularly, it is well-known that polycrystalline CVD diamonds have a large concentration of grain boundaries (Balducci et al, 2005) where electron traps are concentrated or in more defective regions (Manfredotti et al, 2006).…”
Section: Influence Of Defect and Impurity Levels On The Dose Rate Linmentioning
confidence: 96%
“…In addition to the influence of N s on the defect levels of the crystals, the more defective nature of the CVD diamonds compared to the HPHT diamond could also be ascribed to their polycrystalline structure as polycrystalline materials have high defect densities due to their non-homogeneous structure (Bergonzo et al, 2007). Particularly, it is well-known that polycrystalline CVD diamonds have a large concentration of grain boundaries (Balducci et al, 2005) where electron traps are concentrated or in more defective regions (Manfredotti et al, 2006).…”
Section: Influence Of Defect and Impurity Levels On The Dose Rate Linmentioning
confidence: 96%
“…Priming Diamond X-ray detectors generally require priming (or pre-irradiation) to stabilise the short-term detector response, through the filling of electronic trap states arising from defects in the diamond [23]. Therefore, prior to measurements, the devices were subjected to a cumulative dose of 1000 MU at 75 kV in two consecutive fractions of 500 MU.…”
Section: Radiation Sourcesmentioning
confidence: 99%
“…Such stable behavior is essential for power device applications [4]. The relationship between defects and device properties has been discussed by several research groups [5][6][7][8][9][10]. It is assumed that defects degrade the performance of power devices.…”
Section: Introductionmentioning
confidence: 99%