“…This implies that a stronger internal electric field can be applied across the heterojunction, facilitating separation/transfer of holes from the active layer to the HTL. , The region (known as the depletion width) shows that the drift potential dominates the charge transport. , While the ETL/active layer heterojunction provides strong leverage for electron collection within the CQDPV, a relatively weak energy level bending at the active layer/HTL interface has raised interest regarding the hole collection capability of the HTL. , In this regard, the pronounced energy level bending provided by the hybrid-passivated HTL can augment the local drift field at the interface, resulting in more effective charge separation at the interface. ,, Since the depletion width is associated with doping concentrations of the materials, the feature is possibly attributed to enhanced p-doping concentration of the hybrid-passivated HTL, as evidenced from the E F – E V reduction. Capacitance–voltage ( C – V ) measurements with Schottky junction devices further support this hypothesis. , From the Mott–Schottky plots (Figure S7a), p-doping concentrations ( N A ) of the CQD HTLs were estimated and showed an ∼31% enhancement of N A (1.08 (±0.10) × 10 17 to 1.42 (±0.10) × 10 17 cm –3 ) by hybrid passivation (Figure S7b), which was qualitatively consistent with depth-dependent UPS analysis. ,,− Note that the doping concentration may be a consequence of extra trap passivation. In other words, the seamless surface passivation by hybrid treatment led to an enhanced doping concentration, preventing charge scavenging from bound OH.…”