2016 International Conference of Asian Union of Magnetics Societies (ICAUMS) 2016
DOI: 10.1109/icaums.2016.8479652
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Improvement of Stress Induced Reliability Shift in AMR Sensor

Zitu-Tin Lin
1
,
Wen-Jeng Lin
2
,
Fu-Tai Liu
3
et al.
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