2020 4th IEEE Electron Devices Technology &Amp; Manufacturing Conference (EDTM) 2020
DOI: 10.1109/edtm47692.2020.9117895
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Improvement in Electrical Properties of A1/La2O3/ZrO2/ Gate Stack Deposited on LaON Passivated GaAs Substrate

Viral N. Barhate
1
,
Khushabu Agrawal
2
,
Vijay S. Patil
3
et al.
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