Improved Transmission Line Parameter Calculation Through TCAD Process Modeling for Superconductor Integrated Circuit Interconnects

Herbst, Heinrich; Roux, Paul le; Jackman, Kyle; Fourie, Coenrad J.

doi:10.1109/tasc.2020.3006988

Cited by 11 publications

(4 citation statements)

References 5 publications

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“…(1) The perception layer is the perception of the material world, that is, the collection of power information [16]. Through sensors, information acquisition equipment, and other technical means, the information collection of various links such as environmental information, line information, and tower status of transmission line is realized…”

Section: Dynamic Calculation Of System Failure Probability Ofmentioning

confidence: 99%

Application of Internet of Things Energy System in Dynamic Risk Assessment of Composite Fault of Transmission Line

Liu

Jia

Ding

et al. 2022

Wireless Communications and Mobile Computing

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In order to study the application of Internet of things energy system in complex fault risk dynamic assessment of transmission line. Firstly, the concept of power grid dynamic risk assessment is introduced, and the process of power grid dynamic risk assessment system based on Internet of things is designed. Then, it puts forward how to use the ubiquitous Internet of things multisource data to solve the key problems such as dynamic perception of fault probability, dynamic selection of fault set, dynamic generation of post fault state, and dynamic risk assessment of operation process. Finally, taking the maximum operation mode of a provincial power grid in summer 2013 as an example, this paper selects key 500 kV transmission lines for risk assessment, and the actual power grid example shows that. The power grid comprehensive risk assessment system considering the fault characteristics of transmission lines can effectively predict the fault probability of transmission lines; distinguish the two risks of high loss, low probability, and low loss and high probability; and provide guidance for operators. It is practical and effective.

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Section: Dynamic Calculation Of System Failure Probability Ofmentioning

confidence: 99%

Application of Internet of Things Energy System in Dynamic Risk Assessment of Composite Fault of Transmission Line

Liu

Jia

Ding

et al. 2022

Wireless Communications and Mobile Computing

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“…The specific reasons are: the circuit aging process is closely related to its specific working environment and workload, and the circuit evaluation based on the worst-case or empirical model can not reflect the actual differences; The fault protection method caused by circuit aging is to change the existing working state or the overall structure of the circuit. In the process of implementing circuit protection methods, unreasonable circuit parameters will accelerate the aging process of the circuit, which will have an impact on the actual performance of the circuit [18]. For example, adjust the power supply voltage of the circuit.…”

Section: Integrated Circuit Aging Prediction Methods 21 Identificatio...mentioning

confidence: 99%

Design of IC aging prediction method based on logic gate type

MENG

2023

Second International Conference on Electronic Information Technology (EIT 2023)

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The aging of digital integrated circuits will have a certain [impact on the accuracy and reliability of circuits, and even pose a certain threat to the safety of circuits. To solve this problem, an IC aging prediction design method based on logic gate type is proposed. The aging characteristics of IC structure are identified by logic gate type technology, the aging degree index and evaluation algorithm of IC are standardized, and the aging prediction of IC is realized. Finally, experiments show that the IC aging prediction method based on logic gate type has high accuracy and reliability in practical application, and fully meets the research requirements.

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“…This makes RSFQ systems more power-efficient than current technologies. Many studies focus on RSFQ technology, covering circuit and system designs [4][5][6], layout designs [7,8], as well as electronic design automation (EDA) tools and algorithms [9,10].…”

Section: Introductionmentioning

confidence: 99%

High-density superconductive logic circuits utilizing 0 and π josephson junctions

Razmkhah,

Pedram

2024

Eng. Res. Express

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Superconductor Electronics (SCE) is a fast and power-efficient technology with great potential for overcoming conventional CMOS electronics' scaling limits. Nevertheless, the primary challenge confronting SCE today is its integration level, which lags several orders of magnitude behind CMOS circuits. In this study, we have innovated and simulated a novel logic family grounded in the principles of phase shifts occurring in 0 and π Josephson junctions. The fast phase logic (FPL) eliminates the need for large inductor loops and shunt resistances by combining the half-flux and phase logic. Therefore, the Josephson junction (JJ) area only limits the integration density. The cells designed with this paradigm are fast, and the clock-to-Q delay for logic cells is about 4ps. While maintaining over 50% parameter margins for wiring cells. This logic is power efficient and can increase the integration by at least 100 times in the SCE chips.

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Improved Transmission Line Parameter Calculation Through TCAD Process Modeling for Superconductor Integrated Circuit Interconnects

Cited by 11 publications

References 5 publications

Application of Internet of Things Energy System in Dynamic Risk Assessment of Composite Fault of Transmission Line

Application of Internet of Things Energy System in Dynamic Risk Assessment of Composite Fault of Transmission Line

Design of IC aging prediction method based on logic gate type

High-density superconductive logic circuits utilizing 0 and π josephson junctions

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