Improved TEM-cell for EMC tests of integrated circuits

Demakov, Alexander V.; Komnatnov, Maxim E.

doi:10.1109/sibircon.2017.8109915

Cited by 9 publications

(2 citation statements)

References 4 publications

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“…Для расширения полосы рабочих частот рассмотрена TEM-камера с сужением ширины корпуса при его неизменной высоте (рис. 9) [12].…”

Section: исследование форм перехода для согласования регулярной частиunclassified

Development of a TEM-cell for electromagnetic compatibility testing of integrated circuits

Demakov¹,

Komnatnov²

2018

Proceedings of TUSUR

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52УДК 621.372.8 А.В. Демаков, М.Е. КомнатновРазработка TEM-камеры для испытаний интегральных схем на электромагнитную совместимость Представлены результаты разработки TEM-камеры для испытаний интегральных схем с максимальными габаритами 30×30×5 мм 3 на электромагнитную совместимость в диапазоне частот до 5,2 ГГц. Рассмотрены варианты исполнения TEM-камеры, отличающиеся формой согласующих коаксиально-полосковых переходов. Выполнены электродинамический анализ и параметрическая оптимизация переходов с целью уменьшения максимального значения частотной зависимости |S 11 |. На основе полученных при моделировании частотных зависимостей |S 11 | для дальнейшей разработки выбран вариант, обеспечивающий наилучшее согласование (|S 11 | менее минус 30 дБ). Для проверки сходимости результатов вычислены частотные зависимости |S 11 | с более детальным шагом пространственной дискретизации численными методами матрицы линии передачи и конечных элементов. Ключевые слова: TEM-камера, электромагнитная совместимость, интегральная схема, помехоустойчивость.

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Section: исследование форм перехода для согласования регулярной частиunclassified

Development of a TEM-cell for electromagnetic compatibility testing of integrated circuits

Demakov¹,

Komnatnov²

2018

Proceedings of TUSUR

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“…Development and test analysis of open TEM cell [85]Strip-line TEM cell for EMC Test[86] TEM cell for radiation and immunity measurement of transmission line[87] TEM cell improvement for testing IC[88] …”

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confidence: 99%

A review of measurement of electromagnetic emission in electronic product: Techniques and challenges

Yuwono

Baharuddin

Misran

et al. 2022

CST

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Nowadays, electronic products are being used extensively in many fields and applications. The dense population of electronic devices in human life has become a challenge for microwave engineers to ensure that their products can meet the Electromagnetic Compatibility (EMC) standards. Complex electronic products with smaller sizes and denser components will be a challenge for compliance with EMC standards. In addition, the occurrence of non-stationary emission at certain operating modes becomes a challenge for analysis. Error in analyzing EM emissions will make the products unable to meet the requirements of EMC standards; hence, they will be prohibited to be marketed. Currently, there are two methods of emission analysis, i.e. by measurement and modeling or computation. There are some problems, however, in the analysis of EM emissions regarding the area of test, complexity, DUT positioning error, installation cost, and time consumption. In this paper, the analysis techniques for EM emissions including Open Area Test Site (OATS), Anechoic chamber, Transverse Electromagnetics TEM Cell, Compact Antenna Test Range (CATR) and near field scanning are reviewed comprehensively. This survey covered EMC standards, principles of EM emission measurement techniques, advantages and disadvantages of EM emission measurement techniques, studies and applications of each technique, recommendations for which technique to be used, and challenges for future research in EM emission measurement. The final section of this paper discusses the challenges for near-field measurements related to the non-stationary emissions phenomenon. This papers also presents the challenges of how to detect and characterize them.

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TEM cell for Testing Low-profile Integrated Circuits for EMC

Demakov

Komnatnov

2020

2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)

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Improved TEM-cell for EMC tests of integrated circuits

Cited by 9 publications

References 4 publications

Development of a TEM-cell for electromagnetic compatibility testing of integrated circuits

Development of a TEM-cell for electromagnetic compatibility testing of integrated circuits

A review of measurement of electromagnetic emission in electronic product: Techniques and challenges

TEM cell for Testing Low-profile Integrated Circuits for EMC

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