2020
DOI: 10.1109/tdei.2019.008351
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Improved physical model of electrical lifetime estimation for crosslinked polyethylene AC cable

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Cited by 16 publications
(6 citation statements)
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“…It is considered that XLPE aging is caused by electrons accelerated by electrical field stress through sub-microvoids (SMVs), resulting in damage to the polymer chains. (11,12) The SMV size will suddenly increase when XLPE cables are subjected to high electrical field stress (E > E d ). In this case, ∆W is proportional to temperature as follows:…”
Section: Physical Meaning Of the Vecmentioning
confidence: 99%
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“…It is considered that XLPE aging is caused by electrons accelerated by electrical field stress through sub-microvoids (SMVs), resulting in damage to the polymer chains. (11,12) The SMV size will suddenly increase when XLPE cables are subjected to high electrical field stress (E > E d ). In this case, ∆W is proportional to temperature as follows:…”
Section: Physical Meaning Of the Vecmentioning
confidence: 99%
“…The lifetime of XLPE can be obtained by a combined stress model (CSM), as previously reported. (4,(10)(11)(12)(13)(14)(15) This model was derived from the physical meaning of each parameter and has high accuracy. However, both the IPM and CSM require a large amount of experimental data for predicting the lifetime.…”
Section: Introductionmentioning
confidence: 99%
“…n is related to the voltage endurance characteristics of the material, so n is physically related to R′. According to the Eyring equation, Bian et al [20] expressed the relation between R′ and n as (7), where R 0 is the reaction rate constant when E = 1 kV/mm.…”
Section: Physical Function Of Nmentioning
confidence: 99%
“…The ageing process described by IPM is essentially that the materials obtain energy from the electric field, produce a series of the local reactions. The local reaction and reaction rate follow the transition state theory describing the reaction path of the chemical reactions [20]. Thus, IPM can also be explained by transition state theory.…”
Section: Understanding the Decrease In The Value Of N Under Thermal Ageingmentioning
confidence: 99%
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