2024
DOI: 10.1016/j.diamond.2024.110905
|View full text |Cite
|
Sign up to set email alerts
|

Improved performance of H-diamond MOSFETs with ZrO2/Al2O3 gate dielectric stacks deposited by electron beam method

Fei Wang,
Wei Wang,
GenQiang Chen
et al.
Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 21 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?