2015
DOI: 10.7567/apex.8.062302
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Improved performance of GaAs tunnel diode by embedding InAs quantum dot layer for tandem solar cells

Abstract: GaAs tunnel diodes (TDs) embedded with an InAs quantum dot (QD) layer were grown and their performance was compared with that of TDs without a QD layer. The TDs embedded with a QD layer showed enhanced peak tunnel current density and lower differential resistivity at zero bias compared with the TDs without a QD layer. The samples were then annealed to mimic the overlayer growth process. It was found that the performance degradation after annealing was smaller for the QD-layer-embedded TDs. The improved charact… Show more

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Cited by 3 publications
(3 citation statements)
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References 23 publications
(30 reference statements)
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“…The InAs QDs embedded tunnel junction is also able to withstand elevated temperatures which the structure undergoes while growing additional unit cells over the tunnel junction in a multi-junction solar cell [49]. During this overlayer growth, the initially grown tunnel junction gets inevitably heated during the growth of complete solar cell structure.…”
Section: Inas Qd Embedded Tunnel Diode Operation Characteristicsmentioning
confidence: 99%
“…The InAs QDs embedded tunnel junction is also able to withstand elevated temperatures which the structure undergoes while growing additional unit cells over the tunnel junction in a multi-junction solar cell [49]. During this overlayer growth, the initially grown tunnel junction gets inevitably heated during the growth of complete solar cell structure.…”
Section: Inas Qd Embedded Tunnel Diode Operation Characteristicsmentioning
confidence: 99%
“…An alternative or complementary way to this doping approach to improve the TJs electrical performance should be to embed nanostructures at the tunneling interface of the TJs. The inclusion of InAs quantum dots [9] or ErAs nanoparticles [10] has shown promising results to enhance the tunneling current density of GaAs TJs. Similarly, the insertion of quantum wells (QWs) in InAlGaAs TJ on an InP substrate enables us to increase by 45 the J peak compared to the bulk TJ [11].…”
Section: Introductionmentioning
confidence: 99%
“…However, growing such TDs as-designed is difficult due to practical limits of the dopants. [17][18][19] Fortunately, sufficiently high hole concentrations (10 19 -10 20 cm −3 ) with low dopant diffusion across neighboring layers and good surface morphology can be obtained by Be-doped p-GaAs that is grown by the low-temperature molecular beam epitaxy (MBE) technique. 20) Meanwhile, the highest achievable electron concentrations in Si-doped n-GaAs are only 10 18 -10 19 cm −3 .…”
mentioning
confidence: 99%