2001
DOI: 10.1063/1.1344230
|View full text |Cite
|
Sign up to set email alerts
|

Improved performance of amorphous silicon thin film transistors by cyanide treatment

Abstract: We have examined the impact of a simple, wet chemical postgrowth treatment of “immersing in KCN solution” on the performance of inverted staggered amorphous silicon n-channel thin film transistors. Results show that the cyanide treatment significantly improves the overall transistor performance by the elimination of defect states.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
2
0

Year Published

2003
2003
2023
2023

Publication Types

Select...
5

Relationship

1
4

Authors

Journals

citations
Cited by 5 publications
(2 citation statements)
references
References 16 publications
0
2
0
Order By: Relevance
“…We have been attempting to improve the performance of a-Si:H solar cells from two different points of view: one is to reduce defects in intrinsic a-Si:H with cyanide (CN), rather than hydrogen termination of Si dangling bonds, and the other is the elimination of impurity doping in the window side p or n layer. The former approach turned out to be effective for improving the performance of a a-Si:H thin-film transistor due primarily to the stabilization of the a-Si:H/a-SiN:H heterointerface [15], but has not yet been verified reproducibly in the stabilization of intrinsic a-Si:H. In the latter approach, we proposed the use of a window layer in which the carrier could be induced by the field effect instead of impurity doping. The possibility was reinforced by the two-dimensional device simulation called a 'field-effect a-Si:H solar cell' (FESC) [16][17][18][19][20].…”
Section: Introductionmentioning
confidence: 99%
“…We have been attempting to improve the performance of a-Si:H solar cells from two different points of view: one is to reduce defects in intrinsic a-Si:H with cyanide (CN), rather than hydrogen termination of Si dangling bonds, and the other is the elimination of impurity doping in the window side p or n layer. The former approach turned out to be effective for improving the performance of a a-Si:H thin-film transistor due primarily to the stabilization of the a-Si:H/a-SiN:H heterointerface [15], but has not yet been verified reproducibly in the stabilization of intrinsic a-Si:H. In the latter approach, we proposed the use of a window layer in which the carrier could be induced by the field effect instead of impurity doping. The possibility was reinforced by the two-dimensional device simulation called a 'field-effect a-Si:H solar cell' (FESC) [16][17][18][19][20].…”
Section: Introductionmentioning
confidence: 99%
“…In this regard, several back-channel modification procedures for attenuating the detrimental influence on the device performance and improving operation characteristics such as "On/Off ratio [2][3][4][5].…”
mentioning
confidence: 99%