2011
DOI: 10.1039/c0ja00181c
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Improved particle location and isotopic screening measurements of sub-micron sized particles by Secondary Ion Mass Spectrometry

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Cited by 43 publications
(33 citation statements)
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“…A major focus for these types of measurements is on improving the sensitivity for the detection of uranium and transuranic isotopes in the presence of isobaric interferences without the need for complex and time-consuming sample preparation methods. Recently, secondary ion mass spectrometry (SIMS) has shown promise as an effective tool for the analysis of nuclear materials with high sensitivity and minimal sample preparation [8][9][10][11]. The sensitivity of SIMS is often defined by useful yield: the number of ions detected over the number of atoms removed during the analysis.…”
Section: Introductionmentioning
confidence: 99%
“…A major focus for these types of measurements is on improving the sensitivity for the detection of uranium and transuranic isotopes in the presence of isobaric interferences without the need for complex and time-consuming sample preparation methods. Recently, secondary ion mass spectrometry (SIMS) has shown promise as an effective tool for the analysis of nuclear materials with high sensitivity and minimal sample preparation [8][9][10][11]. The sensitivity of SIMS is often defined by useful yield: the number of ions detected over the number of atoms removed during the analysis.…”
Section: Introductionmentioning
confidence: 99%
“…Software for automated particle measurement (APM) is used for particle screening measurements. 8,9 The instrument is equipped with a multicollection detector system, which allows simultaneous isotope measurements for elements from lithium up to uranium. This system consists of five moveable collector units that are labeled L2, L1, C, H1, and H2.…”
Section: A Instrumentationmentioning
confidence: 99%
“…Recently, the performance of SIMS measurements for this application has been greatly improved using large geometry-SIMS (LG-SIMS) instruments that provide both automated screening capabilities to locate particles of interest as well as high precision isotopic measurements using a multi-ion counting detector system. [6][7][8][9] Low detection limits and low uncertainties are generally required for isotopic analysis of these micrometer to submicrometer particles. Samples taken from uranium enrichment facilities allow to investigate the production details and the used feed material by analyzing the 234 U/ 235 U and 236 U/ 235 U isotope ratios.…”
Section: Introductionmentioning
confidence: 99%
“…[3][4][5][6][7][8][9][10][11][12] The SIMS allows us to analyze samples easily and rapidly. A main drawback in SIMS is molecular ion interferences by other elements in other particles.…”
Section: -2mentioning
confidence: 99%