Improved empirical method for calculating short circuit current density images of silicon solar cells from saturation current density images and vice versa

Breitenstein, O.; Frühauf, Felix; Turek, Marko

doi:10.1016/j.solmat.2016.04.047

Cited by 9 publications

(5 citation statements)

References 13 publications

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“…Moreover, by applying the method described in Ref. , these high‐resolution J 01 images can be converted into J sc images, which fit well to J sc images measured by LBIC mapping.…”

Section: Alternative Luminescence Evaluation Methodsmentioning

confidence: 67%

“…Figure (c and d) show the local potential or expectation values of the efficiency η and of the open circuit voltage V oc . For calculating these data, Local I–V uses the global flasher value of J sc (here 39,9 mA cm −2 ) and the recently proposed method to estimate local differences of J sc by evaluating J 01 as a measure of the local bulk recombination . We have optimized the parameters of this procedure for this PERC cell to be A = 7 × 10 9 and B = 0.013 by seeking for the best agreement between simulated and LBIC‐measured J sc results, see the results shown in Figure .…”

Section: Typical Resultsmentioning

confidence: 99%

“…By applying the method described in Ref. , the high‐resolution J 01 image in Figure (c) was converted into a high‐resolution J sc image with the results shown in Figure . Here only magnified results of the region of the inserts shown in Figure are displayed.…”

Section: Typical Resultsmentioning

confidence: 99%

“…Image (b) shows the J sc image simulated from the PL‐ J 01 data of Figure (c) after Ref. using the parameters A = 7 × 10 9 and B = 0.013, which were fitted for best agreement between these two images. We see a very good agreement between these two J sc images.…”

Section: Typical Resultsmentioning

confidence: 99%

“…By applying this model and simulating J sc after Ref. , the Local I–V method may predict potential or expectation values of solar cell data like the open circuit voltage V oc , the fill factor FF, or the efficiency η . The physical meaning of these local expectation parameters is that an extended (homogeneous) solar cell having the properties of this position ( x , y ) would show these parameters.…”

Section: Physical Basics Of Imaging Methodsmentioning

confidence: 99%

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Advanced Local Characterization of Silicon Solar Cells

Breitenstein

Frühauf

Bauer

2017

Physica Status Solidi (a)

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Solar cells made from multicrystalline silicon material, which still represent the majority of solar cells produced today, are by nature inhomogeneous devices. Their bulk excess carrier lifetime, which decisively influences the short circuit current density, the saturation current density, and the effective bulk diffusion length, may vary from position to position by an order of magnitude or more. Moreover, such cells may contain ohmic shunts and, in particular in the edge regions, positions of significant depletion region recombination current. The classical local characterization method for solar cells is light beam‐induced current (LBIC) mapping. This method does not give direct information on factors influencing the dark current density. A reliable quantitative local characterization of inhomogeneous cells can be performed by combining dark lock‐in thermography (DLIT) with electro‐ and photoluminescence (EL and PL) imaging. In this contribution, the well‐established and the most recent findings on the application of these methods are reviewed and typical application examples are presented. It is shown that luminescence imaging is most appropriate for local series resistance imaging and for qualitatively imaging of all kinds of recombination‐active defects. DLIT, on the other hand, shows a lower spatial resolution, but is most appropriate for imaging local two‐diode parameters like depletion region‐ and bulk saturation current densities, the latter allowing to draw conclusions also to the local short circuit current density. A comprehensive local characterization of silicon solar cells is possible by applying both DLIT and luminescence imaging, which complement each other.

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“…Moreover, by applying the method described in Ref. , these high‐resolution J 01 images can be converted into J sc images, which fit well to J sc images measured by LBIC mapping.…”

Section: Alternative Luminescence Evaluation Methodsmentioning

confidence: 67%

Section: Typical Resultsmentioning

confidence: 99%

Section: Typical Resultsmentioning

confidence: 99%

Section: Typical Resultsmentioning

confidence: 99%

Section: Physical Basics Of Imaging Methodsmentioning

confidence: 99%

See 3 more Smart Citations