“…To use the RCWA, the grating region should be divided into L thin planar layers (see figure 2). Then the relative permittivity in the lth layer is a periodic function of x and can be represented by Fourier series in the form: Optical set-up of a scanning differential heterodyne microscope: He-Ne laser (1), beam expander (2), Bragg cell (3), half-wave plate (4), beam splitter (5), microobjective (6), scanning stage (7), sample (8), photodetector (9).…”