Implementation of Signal Flow Graph Rules Analysis on Short-Open-Load-Thru Calibration Algorithm

Yob, Rashidah Che; Mahyuddin, Nor Muzlifah; Ain, Mohd Fadzil

doi:10.1007/978-981-10-1721-6_52

Cited by 2 publications

(1 citation statement)

References 3 publications

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“…However, when using a VNA to characterize the S-parameters of a device under test (DUT), losses and phase delays caused by connectors, cables, and transitions that must be used to connect the DUT to the VNA are also included in the measurement results, and these contributions should be excluded. The general method [3][4][5] to eliminate these effects is to perform a calibration procedure to implement a de-embedding using standard calibration kits such as Short-Open-Load (SOL) for a one-port calibration [6], and Short-Open-Load-Thru (SOLT) for a two-port calibration [7].…”

Section: Introductionmentioning

confidence: 99%

Fast microwave calibration system for cryogenic device characterization

et al. 2022

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We designed a calibration system to characterize the performance of microwave devices at low temperatures. This system comprises an in-situ calibration circuit and an adapted thru-reflect-line calibration algorithm, with which we can transfer the reference ports from room temperature to cryogenic temperature with high precision. We validated the circuit and the algorithm at room temperature with better than 0.9 dB accuracy. In addition, we demonstrated how we can extract the actual S 21 of a 20 dB attenuator and a high pass filter at 20 mK using this calibration system. The calibration bandwidth of this system covers from 4.1 GHz to 18 GHz. The requirement that the phase difference between line and thru be greater than 20°determines the lower frequency limit, and the maximum operational frequency of the microwave switch determines the upper frequency limit. This system can be used for fast and accurate analysis of various cryogenic devices such as filters and amplifiers.

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Section: Introductionmentioning

confidence: 99%

Fast microwave calibration system for cryogenic device characterization

et al. 2022

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MMIC on-Wafer Test Method Based on Hybrid Balanced and Unbalanced RF Pad Structures

Bian

Ding

et al. 2018

Electronics

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Nowadays, more and more MMICs (Microwave Monolithic Integrated Circuit), such as limiters and switches, are designed to have balanced and unbalanced test pad structures to solve the challenging size restrictions and integration requirements for MMICs. Hybrid balanced and unbalanced RF (Radio Frequency) probes are adopted for an on-wafer test of the heteromorphy structures. The thru standard based on single balanced or unbalanced structures cannot meet the impedance matching requirements of the hybrid RF probes at the same time, which leads to a dramatic decreasing of the calibration accuracy and cannot satisfy the requirement of MMIC test. Therefore, in this paper, the calibration error estimating of hybrid RF probes based on traditional SOLR (Short Open Load Reciprocal) calibration method is performed, and an on-wafer test approach of MMIC based on hybrid balanced and unbalanced RF probes is proposed which combines the OSL (Open Short Load) second-order de-embedding technique with vector error correction and the matrix transformation technique. The calibration reference plane can be accurately shifted to the probe tip with this method, which greatly improves the test accuracy, and an automatic test system is built for this method based on the object-oriented C# language.

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Implementation of Signal Flow Graph Rules Analysis on Short-Open-Load-Thru Calibration Algorithm

Cited by 2 publications

References 3 publications

Fast microwave calibration system for cryogenic device characterization

Fast microwave calibration system for cryogenic device characterization

MMIC on-Wafer Test Method Based on Hybrid Balanced and Unbalanced RF Pad Structures

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