Implementation of mathematical model of thermal behavior of electronic components for lifetime estimation based on multi-level simulation

Abstract

Abstract:The main purpose of the paper is the proposal of multi-level simulation, suited for the evaluation of the lifetime of critical electronic devices (electrolytic capacitors). The aim of this issue is to imagine about the expected operation of complex and expensive power electronic systems, when the failure of the most critical component occurs. For that reason, various operational conditions and various physical influences must be considered (e.g. mechanical, humidity, electrical, heat stress), where nonlinearities are naturally introduced. Verification of the proposal is given, whereby the life-time estimation of an electrolytic capacitor operated in a DC-DC converter during various operational conditions is shown. At this point electrical and heat stress is considered for lifetime influence. First, the current state in the field of mathematical modeling of the lifetime for electrolytic capacitors, considering main phenomena is introduced. Next, individual sub-models for multi-level simulation purposes are developed, including a thermal simulation model and electrical simulation model. Several complexities of individual models are mutually compared in order to evaluate their accuracy and suitability for further use. Proper simulation tools have been mutually linked and data transfer was secured, in order to have the possibility of investigation of a lifetime depend on the changes of various variables.

Total Cost of Ownership Optimization of Manufacturing Machines with Fast Energy Storage

“…Only capacitor lifetime is considered critical and is explicitly modeled. Well established lifetime models are available for aluminum electrolytic capacitors, which is the de facto standard technology for DC-buses [22]. These lifetime models take the simulated current profiles as input, as well as the ambient temperature, which is set to 45 • C. Predicted lifetimes were validated using the lifetime prediction tools of the capacitor manufacturers themselves [23], [24].…”