Implementation of class‐E/F₃ power amplifiers based on the variations of the MOSFET grading coefficient, built‐in potential and output capacitance along with their roles in MOSFET selectivity

Abstract

Summary In this paper, a theoretical analysis of the class‐E/F3 power amplifier based on the variation of the grading coefficient m1 and its vital role in MOSFET selectivity to operate safely under given design specifications is presented while the nonlinearity of the drain‐to‐source capacitance is considered. Moreover, the importance of Vbi and Cjo in designing the class‐E/F3 amplifier is investigated. To clarify how the grading coefficient m1 and the other mentioned parameters can directly influence the power amplifier performance and also its elements, these MOSFET parameters are considered as the independent variables of the calculated equations and consequently define the horizontal axis of the obtained plots. Accordingly, as the grading coefficient increases, the maximum switch voltage increases and values of the output power and output power capability decline. Moreover, to prove the reliability of the carried‐out analysis in selecting proper MOSFETs, the performances of three amplifier samples utilizing IRF510, IRFZ24N, and 2SK2504 MOSFETs with different grading coefficient m1 and almost similar Vbi and Cjo are studied. Then, by comparing the results of amplifiers with three MOSFETs, IRF510, IRF530, and IRF540, with similar grading coefficient and different values of Vbi and Cjo, the significance of considering the values of Vbi and Cjo is investigated. Eventually, three amplifiers with 2SK2504, IRF510, and IRF530 MOSFETs have been simulated, implemented, and tested and measurement results agreed well with the theoretical and simulation results.

A MOSFET EMC modeling method based on electrical characteristic measurement and simplex optimization and particle swarm optimization

“…Metal oxide semiconductor field effect transistors (MOSFETs) are widely used in various electronic systems, [1][2][3][4] primarily for power control, switching, and other functions. With the trends of miniaturization, integration, multifunctionality, and high frequency in electronic systems, the electromagnetic environment becomes increasingly complex, leading to numerous electromagnetic compatibility (EMC) issues.…”