2002
DOI: 10.1117/12.463844
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Implementation of a Si/SiC hybrid optically controlled high-power switching device

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Cited by 2 publications
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“…However, the test-bench for optical test is much more complicated due to the requirement on the input light power onto a certain area on the chip. As illustrated in Fig 4.1 Optical Test-bench Setup [28] The power at location 4 is the input power to the photodetector. Therefore we can refer to P4 curve in Fig 4.1 during the optical test to determine the illumination power to the chip, without disturbing the alignment of the fiber-chip system.…”
Section: Experiments Plan and Test Bench Setupmentioning
confidence: 99%
“…However, the test-bench for optical test is much more complicated due to the requirement on the input light power onto a certain area on the chip. As illustrated in Fig 4.1 Optical Test-bench Setup [28] The power at location 4 is the input power to the photodetector. Therefore we can refer to P4 curve in Fig 4.1 during the optical test to determine the illumination power to the chip, without disturbing the alignment of the fiber-chip system.…”
Section: Experiments Plan and Test Bench Setupmentioning
confidence: 99%