Implementation and Design of a Novel Student Developed Modular HTOL/HTRB System Using Thermoelectric Control
Nathaniel O'Neal,
Matthew Porter,
Christopher Martino
Abstract:Addressing reliability issues is critical to the successful design and implementation of new semiconductor material systems proposed for next generation power electronic devices. For military systems, reliability is central to successful device designs, often outweighing other design factors. Several reliability testing schemes are central to validating power semiconductor device reliability. Of these, high temperature operating life (HTOL) and high temperature reverse bias (HTRB) testing are often used as go/… Show more
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