2003
DOI: 10.1063/1.1542939
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Implant isolation of ZnO

Abstract: We study ion-irradiation-induced electrical isolation in n-type single-crystal ZnO epilayers. Emphasis is given to improving the thermal stability of isolation and obtaining a better understanding of the isolation mechanism. Results show that an increase in the dose of 2 MeV 16 O ions ͑up to ϳ2 orders of magnitude above the threshold isolation dose͒ and irradiation temperature ͑up to 350°C) has a relatively minor effect on the thermal stability of electrical isolation, which is limited to temperatures of ϳ300-… Show more

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Cited by 65 publications
(32 citation statements)
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(14 reference statements)
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“…Although some of these strong points overlap with another wide bandgap semiconductor GaN, particular advantages of ZnO include bulk growth capability, amenability to conventional chemical and plasma-etching techniques [2], low growth temperature, high radiation hardness [3], and nearly double exciton binding energy.…”
Section: Introductionmentioning
confidence: 99%
“…Although some of these strong points overlap with another wide bandgap semiconductor GaN, particular advantages of ZnO include bulk growth capability, amenability to conventional chemical and plasma-etching techniques [2], low growth temperature, high radiation hardness [3], and nearly double exciton binding energy.…”
Section: Introductionmentioning
confidence: 99%
“…41,42 , which has been explained by generation of ion irradiation-induced traps. The To clarify whether H1 and H2 in Fig.…”
mentioning
confidence: 99%
“…The excitonic effect of this wide-bandgap compound semiconductor can be controlled properly even above room temperature. Its high oscillator strength, radiation hardness, high temperature resistance, simple wet-chemical processability and high exciton-binding energy (which leads to low optical-gain thresholds) can replace GaN [10][11][12]. A ZnObased bipolar device requires p-type ZnO layer, however, achieving p-type doping in ZnO proves difficult due to its asymmetry, which originates from the compensation for intrinsic defects having low formation energy, self-compensation and low solubility of the dopants [13].…”
Section: Introductionmentioning
confidence: 98%