The construction of a simple microcomputer-based modulated photocurrent spectroscopy (MPS) system is described for the determination of localized-state distribution in amorphous semiconductors. The laborious and timeconsuming measurement with a conventional set-up is avoided by the novel use of the combination of a simple and inexpensive computercontrolled pulse generator and a light-emitting diode. Data of localized-state distributions obtained with this system are presented for a prototypical amorphous chalcogenide semiconductor, amorphous As,Se,. The thermally created defect states are found in the material for the first time, and the defect creation energy is estimated to be 0.64 eV.