“…In the approaches of Simitses et al [3,4] and of Goldfeld et al [7,9] only symmetric and axisymmetric imperfection patterns can be used, and more general imperfection patterns cannot be used, such as those obtained using perturbation loads or geometric imperfections from advanced data acquisition systems [10]. Such general imperfection patterns are not necessarily symmetric and can only be represented by appropriate Fourier series such as the half-cosine function proposed by Arbocz [11].…”