Abstract:Impedance Spectroscopy, X-Ray Diffraction and High Resolution Scanning Electron Microscopy have been used to study the effect of extremely fine grain size on electrical properties such as dc-conductivity and activation energies in nanocrystalline Y-stabilized tetragonal zirconia. The samples were prepared from powders produced by the Inert Gas condensation method. X-Ray Diffraction was used to characterize phase and average grain size of the sample. In addition, grain size and microstructure of the sample was … Show more
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