Abstract:One of the main difficulties occurring in printed organic electronics is the intermixing between adjacent layers. This has to be quantified to optimise printed devices. Methods like sputter X-ray photoelectron spectroscopy (XPS) are suitable for this, but also complex, expensive and destructive. We propose impedance spectroscopy as an alternative for quantifying the degree of intermixing non-destructively. Here, after measuring a device's impedance spectrum its concentration profile is determined with a fit fu… Show more
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