2015
DOI: 10.1007/978-3-319-24100-5_5
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Impacts of Dislocations and Point Defects on the Internal Quantum Efficiency of the Near-Band-Edge Emission in AlGaN-Based DUV Light-Emitting Materials

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Cited by 3 publications
(1 citation statement)
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“…The required crystal quality should be discussed on the basis of point defects at the AlGaN QWs as well as the TDD. When the crystal quality is moderately improved, NRCs derived from point defects must be considered [81] because Al vacancies (V Al ) have been revealed to be NRCs in AlGaN QWs [82]. Carrier localization has been clarified to be the reason why GaN with a high TDD of between 10 8 /cm 2 and 10 9 /cm 2 enables the mass production of InGaN-LEDs [83][84][85].…”
Section: Crystal Quality Of Algan On Alnmentioning
confidence: 99%
“…The required crystal quality should be discussed on the basis of point defects at the AlGaN QWs as well as the TDD. When the crystal quality is moderately improved, NRCs derived from point defects must be considered [81] because Al vacancies (V Al ) have been revealed to be NRCs in AlGaN QWs [82]. Carrier localization has been clarified to be the reason why GaN with a high TDD of between 10 8 /cm 2 and 10 9 /cm 2 enables the mass production of InGaN-LEDs [83][84][85].…”
Section: Crystal Quality Of Algan On Alnmentioning
confidence: 99%