Impact of supply voltage and particle LET on the soft error rate of logic circuits

Jiang, Hui; Zhang, H.; Harrington, R. C.; Maharrey, J. A.; Kauppila, J. S.; Massengill, L.W.; Bhuva, B. L.

doi:10.1109/irps.2018.8353586

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Impact of supply voltage and particle LET on the soft error rate of logic circuits

Cited by 4 publications

References 23 publications

Evaluation of Single-Event Upset in FinFET Device

Evaluation of Single-Event Upset in FinFET Device

Encoded Check Driven Concurrent Error Detection in Particle Filters for Nonlinear State Estimation

Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node

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