2016 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD) 2016
DOI: 10.1109/ispsd.2016.7520766
|View full text |Cite
|
Sign up to set email alerts
|

Impact of power electronic device development on power grids

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2018
2018
2024
2024

Publication Types

Select...
4
1
1

Relationship

0
6

Authors

Journals

citations
Cited by 10 publications
(1 citation statement)
references
References 5 publications
0
1
0
Order By: Relevance
“…In this way, it merges the benefits of both the GTO and MOSFET with clear advantages with respect to the IGCT. As of 2016, ratings as high as 8.5 kV/5 kA for SCRs, 6.5 kV/3.8 kA for IGCTs, 6.5 kV/0.75 kA for IGBTs, and 4.5 kV/4 kA for ETOs have been achieved [22].…”
Section: Massimo Guarnierimentioning
confidence: 99%
“…In this way, it merges the benefits of both the GTO and MOSFET with clear advantages with respect to the IGCT. As of 2016, ratings as high as 8.5 kV/5 kA for SCRs, 6.5 kV/3.8 kA for IGCTs, 6.5 kV/0.75 kA for IGBTs, and 4.5 kV/4 kA for ETOs have been achieved [22].…”
Section: Massimo Guarnierimentioning
confidence: 99%