2014
DOI: 10.1016/j.microrel.2013.10.005
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Impact of Ni concentration on the intermetallic compound formation and brittle fracture strength of Sn–Cu–Ni (SCN) lead-free solder joints

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Cited by 36 publications
(13 citation statements)
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“…Electron dispersive X-ray spectroscopy (EDS) mapping was conducted to observe the Ni and Cu distribution. IMCs are known to be finer needle-like shaped Ƞ-Cu6Sn5 [7] with a larger grain boundary area and provide a large area of molten solder in contact with the initial interfacial IMC. In comparison with Sn-0.7wt%Cu solder, scallop shaped Ƞ-Cu6Sn5 interfacial IMCs are known to form [7] with a smaller grain boundary area in contact with molten solder.…”
Section: Methodsmentioning
confidence: 99%
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“…Electron dispersive X-ray spectroscopy (EDS) mapping was conducted to observe the Ni and Cu distribution. IMCs are known to be finer needle-like shaped Ƞ-Cu6Sn5 [7] with a larger grain boundary area and provide a large area of molten solder in contact with the initial interfacial IMC. In comparison with Sn-0.7wt%Cu solder, scallop shaped Ƞ-Cu6Sn5 interfacial IMCs are known to form [7] with a smaller grain boundary area in contact with molten solder.…”
Section: Methodsmentioning
confidence: 99%
“…In addition, Yoon et al [15] had investigated the growth of interfacial Cu6Sn5 in Sn-Cu-Ni solders after thermal ageing and identified that the interfacial intermetallic compound (IMC) activation energy was considered low compared to the activation energy of interfacial IMC in binary Sn-Cu solders. In another study, Yang et al [7] had reported that with Ni additions to Sn-0.7wt%Cu the growth of Cu3Sn interfacial IMC was suppressed which also resulted in the formation of fine needle-like (Cu,Ni)6Sn5 at the solder/substrate interface. In addition, the reported effects of small additions of Ni in Sn-0.7wt%Cu solder alloys have included better fluidity [14,16], alterations to the eutectic composition and promotion of a near eutectic Sn-Cu6Sn5 microstructure, stabilisation of the hexagonal high temperature phase of Cu6Sn5 [17], and suppression of cracking in Cu6Sn5 solder joints formed between Sn-0.7wt%Cu solders and Cu substrates [18].…”
Section: Introductionmentioning
confidence: 99%
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“…Furthermore, the dilute Ni addition has been demonstrated to significantly affect the intermetallics that form during soldering. For example, Ni stabilises the high temperature hexagonal polymorph of Cu6Sn5 at low temperature [9,10], and Sn-0.7Cu-0.05Ni/Cu joints have a fine-grained (Cu,Ni)6Sn5 interfacial layer [11,12] and suppressed growth of the Cu3Sn interfacial layer [11,[13][14][15][16]. It has been further demonstrated that additions of Ni to Sn-0.7Cu solder result in considerable refinement of the Cu6Sn5 primary crystals in the solder bulk, decreasing their size and increasing their number density [17].…”
Section: Introductionmentioning
confidence: 99%
“…Ni is increasingly added to Sn-Ag-Cu-X [2] and next-generation solder compositions [3,4]. The addition of Ni significantly affects the intermetallic reaction layers between the solder and copper [5]; a ~500 ppm Ni addition suppresses the formation of the Cu3Sn layer [6][7][8][9] and results in a finer and smaller (Cu,Ni)6Sn5 layer after reflow [8,10].…”
Section: Introductionmentioning
confidence: 99%