2008
DOI: 10.1002/pssa.200723441
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Impact of irradiation‐induced point defects on electronically and ionically induced magnetic relaxation mechanisms in titano‐magnetites

Abstract: This report deals with the analysis of point‐defect‐induced magnetic after‐effect (MAE) processes occurring in as‐grown, single‐crystalline titano‐magnetite (Fe2.8–D Ti0.2O4), containing B‐site vacancies (D < 0.005). In a foregoing experiment, these processes, situated near 450 K, 200 K and 65 K, have been completely recovered in the course of systematic annealing up to Ta ≤ 1200 K. Analysis of respective annealing kinetics suggested to associate them with vacancy‐ (450 K) and interstitial‐based (200 K) defect… Show more

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Cited by 1 publication
(12 citation statements)
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“…Regarding the annealing behaviour over the full temperature range 80 K T a 1200 K, we recognize three sub-intervals of recovery, cf figures 2, 3 and table 2: (i) 80 K < T a < 500 K, within which most of the radiationinduced extra effects are annealing-thereby reconstituting qualitatively, though with varied amplitude ratios, the original spectrum: cf figures 1(a) and 2(m); (ii) 500 K < T a < 950 K, wherein, with the exception of the 65 K process (figure 3(a)), the relaxation amplitudes undergo only minor modulations; (iii) 950 K < T a < 1200 K, being characterized by the complete annihilation of processes (a) and (c)whereas the radiation-induced component (b) had disappeared already during T a < 500 K. Interestingly, such final process extinction on continued annealing is not observed for relaxation components (d) and (e) whose amplitudes-after crossing a minimum near T a 1050 K-are found to re-grow again on cooling-down from higher annealing temperatures (T a 1050 K), cf figures 2(q), (r) and 3. This astonishing behaviour, already previously observed in related annealing studies [17,18], will be further discussed in section 4.3.…”
Section: Resultssupporting
confidence: 69%
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“…Regarding the annealing behaviour over the full temperature range 80 K T a 1200 K, we recognize three sub-intervals of recovery, cf figures 2, 3 and table 2: (i) 80 K < T a < 500 K, within which most of the radiationinduced extra effects are annealing-thereby reconstituting qualitatively, though with varied amplitude ratios, the original spectrum: cf figures 1(a) and 2(m); (ii) 500 K < T a < 950 K, wherein, with the exception of the 65 K process (figure 3(a)), the relaxation amplitudes undergo only minor modulations; (iii) 950 K < T a < 1200 K, being characterized by the complete annihilation of processes (a) and (c)whereas the radiation-induced component (b) had disappeared already during T a < 500 K. Interestingly, such final process extinction on continued annealing is not observed for relaxation components (d) and (e) whose amplitudes-after crossing a minimum near T a 1050 K-are found to re-grow again on cooling-down from higher annealing temperatures (T a 1050 K), cf figures 2(q), (r) and 3. This astonishing behaviour, already previously observed in related annealing studies [17,18], will be further discussed in section 4.3.…”
Section: Resultssupporting
confidence: 69%
“…(ii) In the temperature range 950 K < T a < 1200 K we observe here too, analogous to the previous annealing of the as-grown crystal (figure 1(a)) [17], concomitant recombination of the 200 and 450 K relaxation processes (cf figure 5) with coinciding reaction order γ = 2, closely related activation enthalpies of Q = 2.43 ± 0.05 eV and rate constants K 0 2 10 8.0±0.5 s −1 . (iii) Inset (c) of figure 5 summarizes the 65 K recovery analyses of differently pretreated crystals: (i) asgrown [17]; (ii) as-grown and subsequently e − -irradiated (actual state); (iii) complete annihilation of the as-grown MAE spectrum, followed by e − -irradiation [18]. The determined reaction parameters agree within the limits: Q = 2.45 ± 0.3 eV, K 0 1,2 = 10 8.0±0.3 s −1 , tending to reaction order γ = 2.…”
Section: Resultsmentioning
confidence: 99%
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