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2013
DOI: 10.1109/jphotov.2013.2259895
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Impact of Iron Surface Contamination on the Lifetime Degradation of Samples Passivated by Fired Al $_{\bf 2}$O$_{\bf 3}$/SiN$_{\bm x}$ Stacks

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Cited by 2 publications
(3 citation statements)
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“…Note that the classical Sah-Noice-Shockley J 02 current is negligibly small for usual lifetimes in silicon. [65] Measurable J 02 currents in solar cells flow only in positions where extended defects, like scratches or the cell edge, cross the pn-junction. [65,66] Therefore the J 02 distribution should be dissimilar to the J 01 distribution, and in most cases it is.…”
Section: Dlit Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Note that the classical Sah-Noice-Shockley J 02 current is negligibly small for usual lifetimes in silicon. [65] Measurable J 02 currents in solar cells flow only in positions where extended defects, like scratches or the cell edge, cross the pn-junction. [65,66] Therefore the J 02 distribution should be dissimilar to the J 01 distribution, and in most cases it is.…”
Section: Dlit Resultsmentioning
confidence: 99%
“…[65] Measurable J 02 currents in solar cells flow only in positions where extended defects, like scratches or the cell edge, cross the pn-junction. [65,66] Therefore the J 02 distribution should be dissimilar to the J 01 distribution, and in most cases it is. [29,35,44] We believe that for the PERC cell investigated here, which shows an extremely high ratio of local dark current densities (factor 20), the RESI-R s concept, based on the model of independent diodes, leads to some errors in attributing currents to J 01 and J 02 contributions.…”
Section: Dlit Resultsmentioning
confidence: 99%
“…Surface passivation and P-diffusion have been widely used as standard industrial technique procedure to manufacture a solar cell with high conversion efficiency on p-Si wafer. In addition to the formation of the emitter of the cell, P-diffusion is also effective in removing residual iron in the bulk p-Si by a gettering effect [1,2] . This gettering effect is important, since iron is a lifetime killer [3,4] at a concentration as low as 10 10 -10 11 cm −3 in silicon and its contamination at this level is unavoidable in the process of crystal growth and wafer manufacture.…”
Section: Introductionmentioning
confidence: 99%