Impact of deposition conditions on the crystallization kinetics of amorphous GeTe films

Khoo, Chee Ying; Hai, Liu; Sasangka, Wardhana Aji; Made, Riko I; Tamura, Nobumichi; Kunz, Martin; Budiman, Arief Suriadi; Gan, Chee Lip; Thompson, Carl V.

doi:10.1007/s10853-015-9493-z

Cited by 35 publications

(11 citation statements)

References 37 publications

(50 reference statements)

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“…A detailed description of the microdiffraction beamline is given elsewhere [14][15][16][17]. The efficacy of synchrotron X-ray diffraction in enabling technologically important innovations, including in microelectronics and nanotechnology industries, in additions to next generation silicon solar PV technologies, have recently been reported and described elsewhere [18][19][20][21][22] Figure 2a shows the schematic of the microdiffraction experiment setup and an actual picture of the setup is shown in Figure 2b. The sample was mounted on the stage with its back (Figure 1b) facing the X-ray beam, as X-rays cannot penetrate the front glass due to absorption.…”

Section: Case Study 1: Effect Of Encapsulation Polymer Modulus On Celmentioning

confidence: 99%

Thermomechanical residual stress evaluation in multi-crystalline silicon solar cells of photovoltaic modules with different encapsulation polymers using synchrotron X-ray microdiffraction

Tippabhotla

Diesta²,

Zhang³

et al. 2019

Solar Energy Materials and Solar Cells

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Photovoltaic (PV) module reliability issues due to silicon cell cracking is gaining more and more attention due to increasing demand for solar power and reduction of cell thickness to reduce cost. Recent reports show significant effect of encapsulation polymer material on cell cracks leading to the idea of tailoring encapsulation materials for more reliable PV modules. This paper investigates the effect of encapsulation modulus on the cell residual stress using Synchrotron scanning X-ray microdiffraction (µSXRD), which has been proven to be an effective technique to probe the stress in silicon solar cells, especially once they are encapsulated. The post lamination residual stress in the encapsulated multi-crystalline silicon (mc-Si) solar cells was reported for the first time using µSXRD in this manuscript and provide quantitative evaluation of the effect of encapsulation modulus on the cell residual stress. Further simple approximate finite element (FE) model was also developed to evaluate the effect of the encapsulation polymer on the cell stress. The FE simulations predict the trend of the stress variation with encapsulation polymer modulus very well. Dynamic mechanical analysis and rheological testing of the encapsulation polymers was also performed to correlate the polymer behaviour with the experimental and simulated stresses. Both experimental and simulation results show a similar trend of significant cell stress variation with encapsulation polymer modulus. In the case of external loading, the temperature of load application is observed to be very significant as it dictates the elastic state of the encapsulant, leading to critical conclusion that the encapsulant needs to be selected based elastic behaviour over the temperature history of the encapsulant during module fabrication and operation. The results and discussion presented are expected to be very useful for development of more reliable PV modules.

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Section: Case Study 1: Effect Of Encapsulation Polymer Modulus On Celmentioning

confidence: 99%

Thermomechanical residual stress evaluation in multi-crystalline silicon solar cells of photovoltaic modules with different encapsulation polymers using synchrotron X-ray microdiffraction

Tippabhotla

Diesta²,

Zhang³

et al. 2019

Solar Energy Materials and Solar Cells

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“…Synchrotron Laue X-ray Microdiffraction (µSLXRD) is a type of X-ray Laue diffraction technique that has been used for a variety of applications for its non-destructive nature and suitability in examining the defect structure of sub-micron and nanometer scale specimens [4,7,[23][24][25][26][27][28][29][30]. The X-ray beam comes from a powerful synchrotron source, which can be focused into a submicron spot size, close to the grain size of most single crystalline materials.…”

Section: The Technique: Synchrotron Laue X-ray Microdiffractionmentioning

confidence: 99%

Probing Plasticity and Strain-Rate Effects of Indium Submicron Pillars Using Synchrotron Laue X-Ray Microdiffraction

Ali

Tamura

Budiman

2018

IEEE Trans. Device Mater. Relib.

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A nondestructive ex situ Synchrotron Laue X-ray Microdiffraction (µSLXRD) technique is used to investigate the plasticity mechanisms in the metallic nanostructures and their evolution at high homologous temperatures through analyzing low melting temperature metals such as tin. Without the use of expensive high temperature equipment, the current approach of studying plasticity mechanisms at high temperature is enabled by the low melting behaviors of the samples allowing them to provide insights on high temperature deformation mechanisms, such as thermally activated dislocation climbs. Nanopillars with a diameter near 1µm were deformed by uniaxial compression to strains of in excess of 20% at a strain rate of approximately 0.001s -1 .Defect density evolution in the nanopillars was evaluated by synchrotron Laue X-ray microdiffraction (µSLXRD) before and after deformation (ex situ). It was found from the Laue peak broadening measurements that there was no significant change in the dislocation density of the same pillar before and after such an extent of deformation. These findings were being compared to similar experimental results of indium and gold nanopillars (from our previous reports). They were found to be in stark contrast to our previous results with indium (although both are low melting temperature metals) where the synchrotron Laue X-ray microdiffraction showed significant peak broadening -before vs. after the uniaxial compression to a similar amount of deformation. It appears high temperature plasticity mechanism in tin nanostructures involves significant lattice diffusion behavior, as opposed to simple displactive behavior (through dislocation movements) that has been proposed in recent studies of tin nanostructures. AbstractA nondestructive ex situ Synchrotron Laue X-ray Microdiffraction (µSLXRD) technique is used to investigate the plasticity mechanisms in the metallic nanostructures and their evolution at high homologous temperatures through analyzing low melting temperature metals such as tin. Without the use of expensive high temperature equipment, the current approach of studying plasticity mechanisms at high temperature is enabled by the low melting behaviors of the samples allowing them to provide insights on high temperature deformation mechanisms, such as thermally activated dislocation climbs. Nanopillars with a diameter near 1µm were deformed by uniaxial compression to strains of in excess of 20% at a strain rate of approximately 0.001s -1 .Defect density evolution in the nanopillars was evaluated by synchrotron Laue X-ray microdiffraction (µSLXRD) before and after deformation (ex situ). It was found from the Laue peak broadening measurements that there was no significant change in the dislocation density of the same pillar before and after such an extent of deformation. These findings were being compared to similar experimental results of indium and gold nanopillars (from our previous reports). They were found to be in stark contrast to our previous results with indium (although both are low ...

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“…Thin lm photovoltaic (PV) cell, which is capable of effectively converting solar energy into electrical energy, is one of the most signicant subjects in semiconductor technologies. [1][2][3][4][5][6] The monolithic triple junction cells (GaInP/GaInAs/Ge) are preferred in many elds like aircras and space satellites 7,8 for their high efficiency up to 30% air mass zero (AM0). [9][10][11][12][13][14][15] However, the mechanical stress and fracture of the multilayer PV cells introduced during manufacture and its service process play crucial roles in light-electricity conversion performances and their lifespan.…”

Section: Introductionmentioning

confidence: 99%

Residual stress analysis of thin film photovoltaic cells subjected to massive micro-particle impact

Xiao

et al. 2020

RSC Adv.

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Impact of deposition conditions on the crystallization kinetics of amorphous GeTe films

Cited by 35 publications

References 37 publications

Thermomechanical residual stress evaluation in multi-crystalline silicon solar cells of photovoltaic modules with different encapsulation polymers using synchrotron X-ray microdiffraction

Thermomechanical residual stress evaluation in multi-crystalline silicon solar cells of photovoltaic modules with different encapsulation polymers using synchrotron X-ray microdiffraction

Probing Plasticity and Strain-Rate Effects of Indium Submicron Pillars Using Synchrotron Laue X-Ray Microdiffraction

Residual stress analysis of thin film photovoltaic cells subjected to massive micro-particle impact

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